논문 해외 국제전문학술지(SCI급) High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method
- 학술지 구분 국제전문학술지(SCI급)
- 게재년월 2020-01
- 저자명 Young Min Park, Joon Sik Park, Choong-Heui Chung, Sangyeob Lee
- 학술지명 Data in brief
- 발행처명 ELSEVIER
- 발행국가 해외
- 논문언어 외국어
- 전체저자수 4
홈페이지
논문 초록 (Abstract)
This article provides data on the scanning tunnelling microscopy (STM), atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) images of InAs(001) surface. Using the frequency-modulation (FM) method in AFM and KPFM, atomic resolution topography and contact potential difference (CPD) images of InAs(001) surface were obtained. The InAs(001) surface reconstruction images observed by STM and AFM are compared. The effect of AFM tip condition and tip-sample distance to AFM and KPFM imaging is verified by measuring frequency shift vs. tipsample distance spectroscopy. This data article is related to the article entitled, “Kelvin prove force microscopy and its application” (Melitz et al., 2011) [1].