논문 해외 국제전문학술지(SCI급) Interfacial Triggering of Conductive Filament Growth in Organic Flexible Memristor for High Reliability and Uniformity
- 학술지 구분 국제전문학술지(SCI급)
- 게재년월 2019-07
- 저자명 김민회,Lee, SH (Lee, Sin-Hyung),Park, HL (Park, Hea-Lim),Kang, SJ (Kang, Sujie),Lee, SD (Lee, Sin-Doo)
- 학술지명 ACS APPLIED MATERIALS INTERFACES
- 발행처명 AMER CHEMICAL SOC
- 발행국가 해외
- 논문언어 외국어
- 전체저자수 5
홈페이지논문 초록 (Abstract)
We demonstrate the physical pictures of the localization of the conductive filaments (CFs) growth in flexible electrochemical metallization (ECM) memristors through an interfacial triggering (IT) into the polymer electrolyte. The IT sites (ITSs), capable of controlling the pathways of the CF growth, are formed at the electrode-polymer interfaces via the Ostwald ripening at low temperatures (below 230 degrees C). The injection and migration of metal ions and the resultant CF growth are found to be effectively controlled through the ITSs with the local electric field enhancement. The reliability, uniformity, and switching voltage of the device are much improved by the presence of the ITSs. Our flexible ECM memristor exhibits a high mechanical flexibility and a stable memory performance under repeated bending deformations.