논문 해외 국제전문학술지(SCI급) Confocal laser scanning microscopy as a real-time quality-assessment tool for industrial graphene synthesis
- 학술지 구분 국제전문학술지(SCI급)
- 게재년월 2020-10
- 저자명 이장원,Kim, DJ (Kim, Dong Jin),Suh, Y (Suh, Yeonjoon),Jeong, H (Jeong, Heejeong),Jo, I (Jo, Insu),Moon, J (Moon, Joonhee),Park, M (Park, Mina),Woo, YS (Woo, Yun Sung),Hong, BH (Hong, Byung Hee)
- 학술지명 2D MATERIALS
- 발행처명 IOP PUBLISHING LTD
- 발행국가 해외
- 논문언어 외국어
- 전체저자수 9
- 원문 링크 https://doi.org/10.1088/2053-1583/aba1d5
홈페이지첨부 파일
논문 초록 (Abstract)
For the industrial quality control (QC) of the chemical vapor deposition (CVD) graphene, it is essential to develop a method to screen out unsatisfactory graphene films as efficiently as possible. However, previously proposed methods based on Raman spectroscopy or optical imaging after chemical etching are unable to provide non-invasive and fast analysis of large-area graphene films as grown on Cu foil substrates. Here we report that the reflection mode of confocal laser scanning microscopy (CLSM) provides a high-contrast image of graphene on Cu, enabling the real-time evaluation of the coverage and quality of graphene. The reflectance contrast,Rc, was found to be dependent on the incident laser wavelength, of which the maximum was obtained at 405 nm. In addition,Rcdecreases with increasing defect density of graphene. The dependence ofRcon the graphenes quality and laser wavelengths were explained by the tight-binding model calculation based on the Fresnels interference formula. Thus, we believe that the reflection mode CLSM would be a very powerful quality-assessment tool for the mass production of CVD graphene films grown on Cu.